LAM 839-101612-885

LAM 839-101612-885

LAM 839-101612-885

ABB GFD563A101 3BHE046836R0101
ABB GFD563A102 3BHE046836R0102
ABB PPD517 A3011 3BHE041576R3011
ABB 3BHB009885R5231,PHASEMODULE S-093R
ABB 3BHE031197R0001
ABB UAD155A0111 3BHE029110R0111
ABB PPD513A0E-110110 3BHE039724R0E41
H200, RTX4090, RTX5090
S-093S 3BHB030475R0009和S-093S 3BHB030475R0309
ABB PCS 6000 Wind
3BHE055094R0002 GBU72
ABB GRID BREAKER UNIT GBU72 3BHE055094R0002 / 3BHE031197R0001 / 3BHB030310R0001
ABB PCS6000 PRODUCT FAMLIY
AMAT 0010-27983
ABB S-073N ALU 3BHB009884R5211
ABB S-093H 3BHB030478R0309

LAM 839-101612-885

Product Name
LAM 839-101612-885 Plasma Etch Chamber Control Module (serves as a “precision regulator” in semiconductor plasma etching systems, specializing in controlling plasma parameters and process conditions during wafer etching. With high-precision control capabilities and robust compatibility, it ensures the accuracy and uniformity of semiconductor device patterns)
Product Description
LAM 839-101612-885
The LAM 839-101612-885 module is a critical control component designed for LAM Research’s plasma etch systems, widely used in semiconductor manufacturing processes such as logic chip and memory device fabrication. In the plasma etching of 3nm and advanced node wafers, this module precisely regulates key process parameters including radio frequency (RF) power, chamber pressure, gas flow rates, and electrode temperature. By maintaining RF power stability within ±0.1% and pressure fluctuations below ±0.5mTorr, it ensures the etch rate uniformity across the wafer (≤1% variation) and critical dimension (CD) control accuracy (±0.5nm), which are essential for fabricating high-density integrated circuits.
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